VK-X1100 Keyence 3D Laser Scanning Confocal Microscope | Industify
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Keyence VK-X1100 [urunkategori] - industify.com
Keyence

VK-X1100 Keyence 3D Laser Scanning Confocal Microscope

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Product information
Model

VK-X1100
Type

Head unit
Total magnification

800 x*1, Up to 28
Field of view (minimum range)

11 µm to 7, 398 µm
Frame rate (laser measurement speed)

4 to 125 Hz, 7, 900 Hz*2
Measurement principle

16-bit photomultiplier: High-definition color CMOS, Automatic upper/lower limit setting, Focus variation, high-speed light intensity optimization (AAGII), Pinhole confocal optical system, poor reflected light intensity supplement (Double Scan)
Height measurement

0.2 + L /100 µm or less (L = Measuring length)*3, 0.5 nm, 000 steps, 10 x: 100 nm, 16 bits, 20 x: 40 nm, 20 x: 50 nm, 5 x: 500 nm, 50 x: 12 nm, 50 x: 20 nm, 700
Width measurement

1 nm, 10 x: 400 nm, 20 x: 100 nm, 20 x: 120 nm, 5 x: 400 nm, 50 x: 50 nm, Measured value ±2 % or less*3
XY stage configuration

100 mm x 100 mm 3.94" x 3.94", 70 mm x 70 mm 2.76" x 2.76"
Observation

coaxial illumination, High-resolution color CMOS image 16-bit laser color confocal image Confocal + ND filter optical system C-laser differential interference image, Ring illumination
Measurement laser light source

1 mW, 404 nm, Class 2 laser product (IEC60825-1, FDA (CDRH) Part 1040.10*4), Violet semiconductor laser
Power supply

100 to 240 VAC, 150 VA, 50/60 Hz
Weight

Approx. 13.0 kg
Brand

Keyence
Description

Description

Keyence VK-X1100 3D Laser Scanning Confocal Microscope

The Keyence VK-X1100 3D Laser Scanning Confocal Microscope offers unmatched precision and advanced measurement capabilities, providing users with high-definition color images and extremely accurate measurements. With a total magnification of up to 28,800x and height measurements accurate to 0.5 nm, this microscope ensures detailed and precise imaging for a wide range of applications.

Users can benefit from the fast laser measurement speed of 4 to 125 Hz, allowing for efficient data capture and rapid image processing. The XY stage configuration with automatic upper/lower limit setting enables easy sample positioning and reliable measurements. Additionally, the Violet semiconductor Laser light source ensures reliable and consistent performance for accurate results every time.

  • Ultra-high magnification for detailed imaging
  • Rapid laser measurement speed for efficient data capture
  • Precise and accurate height measurements
  • Automatic upper/lower limit setting for ease of use
  • Reliable performance with a high-quality laser light source

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