VK-X3050 Keyence 3D Surface Profiler

Description

Keyence VK-X3050 3D Surface Profiler

For professionals in industries such as semiconductor manufacturing, quality control, and research and development, the Keyence VK-X3050 3D Surface Profiler offers unparalleled precision and efficiency in surface measurement. With advanced measurement principles including laser confocal, focus variation, and white light interferometry, users can achieve highly accurate and detailed results for a wide range of applications. The powerful semiconductor laser with a 661nm wavelength ensures fast and reliable measurements, while the high-definition color CMOS and 16-bit photomultiplier guarantee exceptional image quality and data accuracy.

• Obtain precise measurements with sub-nanometer resolution for enhanced product quality and performance.
• Efficiently analyze surfaces in various fields such as microelectronics, automotive, and aerospace for comprehensive insights.
• Experience reduced measurement time and increased productivity with the high-speed laser measurement capabilities of the VK-X3050.

The Keyence VK-X3050 3D Surface Profiler offers a user-friendly interface and versatile configuration options, making it a valuable tool for professionals seeking to streamline their surface analysis processes. With a wide field of view, environmental resistance, and a powerful XY stage configuration, this innovative profiler ensures accurate and reliable results in diverse operating conditions. Experience the precision and efficiency of the VK-X3050 for enhanced quality control, research, and development applications across various industries.