Name: VK-X250K Keyence 3D Laser Scanning Confocal Microscope | Industify
Brand: Keyence
Price: 1.00 USD
Availability: InStock

Model

VK-X250K

Total magnification

Up to 28000×*1

Field of view (minimum range)

11 µm to 5400 µm

Frame rate

4 to 120 Hz, 7900 Hz*2

Measurement principles

16-bit photomultiplier, Automatic upper/lower limit setting, high-speed light intensity optimization (AAGII), Pinhole confocal optical system, poor reflected light intensity supplement (Double Scan)

Height measurement

0.2+L/100 µm or less (L=Measuring Length)*3, 0.5 nm, 14 million steps, 150× 12 nm *3, 16 bits, 20× 40 nm, 50× 12 nm

Z stage configuration

128 mm 5.039" (option), 28 mm 1.102", Base with separate measuring head

Width measurement

±2%*3, 1 nm, 150× 20 nm *3, 20× 100 nm, 50× 40 nm

XY stage configuration

50 mm × 50 mm 1.97" × 1.97" 100 mm × 100 mm 3.94" × 3.94"*4, 70 mm×70 mm 2.76" × 2.76"

Observation

3072×2304, Super-high-resolution color CCD image16-bit laser color confocal imageConfocal + ND filter optical systemC-laser differential interference image

Measurement laser light source

0.95 mW, 408 nm, Class 2 laser product (IEC60825-1), Violet laser

Weight

Approx. 11 kg, Approx. 26 kg (sensor head detached: approx. 10 kg)

Brand

Keyence

Description

Keyence VK-X250K 3D Laser Scanning Confocal Microscope

The Keyence VK-X250K 3D Laser Scanning Confocal Microscope offers superior image quality and high-resolution measurements, providing researchers and professionals with precise and detailed observations for their projects. With automatic upper/lower limit setting and light intensity optimization, users can easily achieve accurate measurements and enhance their workflow efficiency. The pinhole confocal optical system ensures clear imaging, allowing for in-depth analysis of samples and specimens.

Equipped with a 16-bit photomultiplier and height measurement as low as 0.5 nm, the VK-X250K enables users to capture fine details and conduct highly precise measurements with minimal margin of error. The XY stage configuration and Z stage configuration provide flexibility in sample positioning, allowing for comprehensive observation of various angles and sections. Additionally, the super-high-resolution color CCD image and laser color confocal image capabilities offer detailed visual representation of samples for comprehensive analysis.